Safa Kasap
Safa Kasap is currently Canada Research Chair (Tier 1) and Professor of Electronic and Optoelectronic Materials and Devices at the University of Saskatchewan in Canada. He works closely with scientists at the Canadian Light Source (The Canadian Synchrotron) on campus, and with industry, for the development of new functionalities in glasses for applications in radiation detection and medical imaging. He has two widely used textbooks: Principles of Electronic Materials and Devices, 3rd Ed (McGraw-Hill) and Optoelectronics and Photonics, 2nd Ed (Prentice-Hall: Pearson). He is the Deputy Editor of J. Materials Science: Materials in Electronics (Springer) and a Co-Editor of the Springer Handbook of Electronic and Photonic Materials. Professor Kasap is Fellow of the Royal Society of Canada, the American Physical Society and SGT in the UK.

A confocal fluorescence microscope is used to read out the distribution of reduced
Sm2+-ions by their characteristic photoluminescence (PL) emission.
The PL emission from Sm3+ and Sm2+
ions have distinctly different
PL characteristics and can be distinguished. The technique is similar to that reported
for Sm-doped fluorophosphate and fluoroaluminate glasses for MRT where the x-ray
induced Sm3+ --> Sm2+
valence reduction occurred within the glass matrix [2].
irradiated dosimetric plate
at a high scanning speed in confocal fluorescence microscopy. In addition, we show
that the dose range that can be detected is several thousands of gray, and x-ray dose
distribution is detected at a micrometer scale. Further, the x-ray induced
Sm2+ signal
can be erased by heating the irradiated sample at a suitable high temperature; or by
exposing it to UV light. The erased glass-ceramic plate can be used again with very
little variation in its response characteristics as a dosimetric detector. The new
Sm-doped oxyfluoride glass ceramic containing dispersed
CaF2:Sm3+ nanocrystals
reported in this work shows potential for practical use in high-dose, high-resolution
dosimetry for MRT.